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Themes

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Listing of works with the partition by the subject of reports. Click on the work title to see its details. The selected set may be restricted by specifying a range of conference years, or by selecting a specific topic.

Select: from 2005 2006 2008 2010 2012 2014 2016 2018 2020 2021 2022 2023 2024 to 2005 2006 2008 2010 2012 2014 2016 2018 2020 2021 2022 2023 2024 year

All topics ADC design problems Cellular automata Design of System-on-chip (SoC) and IP-blocks Design of VLSI elements Design of VLSI signal processors Design of analog and mixed functional blocks of VLSI Design of digital functional blocks of VLSI Design of fault-tolerance systems Design of micro-electromechanical systems Design of nanoelectronic devices Design of nanoelectronic devices based on Josephson junctions Design of photodetecting VLSI Design of radiation-resistant VLSI Design of technological processes Designing components for aerospace and navigation technology Genetic algorithms in VLSI CAD Methods and algorithms for automated layout design Methods for high-level simulation Methods of device technology simulation of VLSI Methods of digital information processing and digital filters Methods of electro-thermal simulation Methods of logic synthesis and functional logic simulation ... Methods of simulation of VLSI electrical characteristics Models of devices for circuit simulation Neural networks Problems of development of sensory microcircuitry Simulation of data transfer channels Study of the magnetic properties of materials Unconventional computing systems Web-based VLSI CAD design of memory cells

Selection on topic: Design of technological processes

Selected papers: from 2005 to 2024 year

In selection - 28 papers

A

C

D

E

F

I

M

N

O

P

R

S

T

A
	Absorption of Light by a Nanowire with Transitions of Carriers from the Valence Band to Donor States in the Presence of an Electric Field Application of autophotoelectronic semiconductor microstructures for the analysis of gas mixes Application of quasi-hydrodynamic model for the analysis of electronic transport in field and bipolar transistors in conditions of a pulse ionizing radiation in view of the raised temperatures Atomic force microscopy of amorphous electrotechnical alloys Fe(Ni,Cu)(SiB)
C
	Characterization of Micro- and Mesoporous films with the Aid of Adsorption Ellipsometric Porosimetry Method
D
	Design of technology process of silicon-germanium heterobipolar transistors manufacture Development and designing of integrated thermoelements Development of manufacturing techniques of SoI plates
E
	End-to-end technology/device/circuit/system statistical design
F
	Features of electrical conductivity in doped quantum-dimensional systems in a transverse electric field
I
	Investigation and optimization of technological parameters of formation of the logical structure of the cells on "Silicon on Insulator" Investigation of Porous Silicon Dioxide Films Modified with Carbon
M
	Modeling of plasma-chemical etching technology in CF4/H2 mixture Modeling of plasma-chemical etching technology in RF discharge
N
	New issues in application of diamond crystals in microelectronics and nanotechnologies New negative photochromic spiropyran for molecular electronics and photovoltaics New spiropyrans for creating elements of molecular electronics and photonics
O
	Optimization of technological regimes of manufacturing a bipolar heterotransistors
P
	Physical and chemical model of memory and switching effects in thin-film CdSe1-xTex elements Porous Silicon Layers for Heteroepitaxial and Composite Structure Formation
R
	Radiation hardened EEPROM structures integrated with SOI CMOS techology Researching VLSI RAM 8Ê on the basis of SoS structures
S
	Scanning Probe microscopy for nanostructures investigations from micro and nanoelectronics up to biomaterials Simulation of processes of equilibrium and fast heat treatments at formation of the active areas of submicronic and nanomicronic ICs Structure and electrophysical properties of porous carbon-modified dielectrics
T
	TCAD Study of Responsivity of n-channel MOS Dosimeter Fabricated in CMOS Processes The Single Event Upset Forecasting in Digital and Analog Integrated Circuits in SAED 14nm FinFet Technology The Technology of Manufacturing of Complementary Transistors on Gallium Nitride