Home         Authors   Papers   Year of conference   Themes   Organizations        To MES conference

---

Listing of all the works of the organization. Click on the work title to get the full information.

2006
		Stepchenkov Yu.A., Diachenko Yu.G., Grinfeld F.I., Morozov N.V., Plekhanov L.P., Denisov A.N., Filimonenko O.P., Fomin Yu.P. A Library of Self-Timed Elements or ASIC-Technology
		Amelichev V.V., Polomoshnov S.A., Chaplygin Yu.A. Development and designing of integrated thermoelements
2008
		Basaev A.S., Denisov A.N., Konyahin V.V., Maltsev P.P. Methodology of designing of radiation-proof circuits on the basis of BMC for space vehicles
2010
		Saikin D.A., Godovitsyn I.V., Fedorov R.A., Amelichev V.V. Designing and simulation of the differential capacitive MEMS accelerometer main parameters
		Fetisov E.A., Fedirko V.A., Khafizov R.Z., Zolotarev V.I., Zenyuk D.A., Rudakov G.A. Nano-electromechanical thermo-sensitive elements
2012
		Fetisov E.A., Khafizov R.Z., Belin A.M., Rudakov G.A., Zolotarev V.I., Fedirko V.A., Rygalin D.B. IR photosensitive MEMS elements
		Zhukov A.A., Steshenko V.B., Kapustyan A.V. Working out and application problems nano - and the microsystem technique in perspective products of space technics
2014
		Sivchenko A.S. Development of methods for the analysis of defects in the gate dielectric on the test structures in the wafers
		Volobuev P.S., Gavrilov S.V., Ryzhova D.I. The method of static power reducing for CMOS circuits based on sleep transistors with operation speed control
2016
		Sivchenko A.S. Methods electromigration analysis conducting lines using the accelerated measurement test structures located in the wafer
		Moskovskaya Y., Sorokoumov G., Bobrovsky D.V., Nikiforov A.Y., Denisov A.N., Snicar V.G., Zhukov A.A., Ulanova A.V. Rational composition of typical grading system for ASIC’s radiation hardness testing
2022
		Volobuev P.S., Korshunov A.V., Poryadina M.V. An integrated LDO regulator for self-powered systems