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Chumakov A.I.

National Research Nuclear University "MEPHI"

Listing of all the works of the author. Click on the work title to get the full information.

2008
		Chumakov A.I., Pechenkin A.A., Egorov A.N., Mavritskiy O.B., Baranov S.V., Vasilyev A.L., Krinitskij A.V. SEE sensitive parameters estimation in VLSI using local laser technique
		Stenin V.Ya., Betelin V.B., Bobkov S.G., Krasnyuk A.A., Osipenko P.N., Cherkasov I.G., Chumakov A.I., Yanenko A.V. Prospects of using submicronic CMOS VLSI in failure-proof equipment working under impact of atmospheric neutrons
2010
		Pechenkin A.A., Vasilyev A.L., Kozlov A.A., Koltsov D.O., Orlov A.A., Tararaksin A.S., Chumakov A.I., Yanenko A.V. Test and Computer Simulation Procedure for Single Event Effect Prediction of ICs in a Space Environment
		Chumakov A.I. Estimation of Single Event Effect Sensitivity Parameters by Local Laser Irradiation
2012
		Ulanova A.V., Sogoyan A.V., Chumakov A.I., Nikiforov A.Y., Petrov A.G. Features of the radiation hardness evaluation for integrated circuits in specialized protective packages
		Egorov A.N., Mavritskiy O.B., Chumakov A.I., Pechenkin A.A., Koltsov D.O. Automated Picosecond Laser Facility for Single Event Effects Simulation in Microelectronic Devices under Space Environment
		Chumakov A.I., Vasilyev A.L., Pechenkin A.A., Savchenkov D.V., Tararaksin A.S., Yanenko A.V. Estimation of ICs SEE Sensitivity Using Local Laser and Pulse Gamma-Ray Technique
2014
		Novikov A.A., Pechenkin A.A., Ryasnoy N.V., Chumakov A.I. SEE sensitivity changes at different TID levels
		Chumakov A.I., Savchenkov D.V., Pechenkin A.A., Mavritskiy O.B., Egorov A.N. Experimental Verification of Some Laser Techniques' Approximations
		Boruzdina A.B., Ulanova A.V., Gorbunov M.S., Chumakov A.I. Dependence of MCU Sensitivity in SRAM on Data Pattern and angle of incident
2016
		Boruzdina A.B., Temirbulatov M.S., Pechenkin A.A., Ulanova A.V., Yashanin I.B., Enns V.I., Yanenko A.V., Chumakov A.I. Features of experimental research methods for memory with error correction
		Chumakov A.I., Sogoyan A.V., Boruzdina A.B., Smolin A.A., Pechenkin A.A. Mechanisms of Multiple Cell Upsets in Memory
		Chumakov A.I. Two-Parameter Model for Estimation SEE Sensitivity of VLSI under Ion Irradiation
2018
		Chumakov A.I., Bobrovsky D.V., Pechenkin A.A., Savchenkov D.V., Sorokoumov G. Non-Stable Single Event Latch-up
		Sogoyan A.V., Chumakov A.I., Smolin A.A. Single Event Rate Evaluation for Modern ICs
2020
		Chumakov A.I. Estimation of single event effect sensitivity in VLSI to neutron irradiation
2022
		Chumakov A.I., Chumakov K.A., Diankov S.U. Evaluation of VLSI Ionization Response Under Pulsed Neutron Exposure