Home         Authors   Papers   Year of conference   Themes   Organizations        To MES conference

ASPECT – a Subsystem of Event Analysis of Self-Timed Circuits

Authors
 Rozhdestvenskij Yu.V.
 Morozov N.V.
 Rogdestvenskene A.V.
Date of publication
 2010

Abstract
 This report deals with a method of asynchronous circuits analysis examining their functionality
independence on gate's delays. The method is based on event models of circuit's behavior. A circuit is defined by logic equations satisfying Muller's hypothesis on delays of logic gates. Suggested method theoretically bases on transition
diagrams (in global states) with their following equivalent transforming into the event models. Developed algorithms of analysis have a strict fundamentality of global states method but do not need in full probing of achievable states of a
circuit. As a result, task's complexity became a polynomial instead of an exponential one. Subsystem ASPECT is a software complex implementing an event method of analysis.
Keywords
 Self-timed circuits; event analysis; computer aided design.
Library reference
 Rozhdestvenskij Yu.V., Morozov N.V., Rogdestvenskene A.V. ASPECT – a Subsystem of Event Analysis of Self-Timed Circuits // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 26-31.
URL of paper
 http://www.mes-conference.ru/data/year2010/papers/m10-145-69491.pdf

Copyright © 2009-2024 IPPM RAS. All Rights Reserved.

Design of site: IPPM RAS