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Golovina E.

Electronic VLSI Engineering & Embedded Systems (ELVEES) R&D Center of Microelectronics

Listing of all the works of the author. Click on the work title to get the full information.

2014
		Golovina E., Makeeva M., Nikolaev A.V., Putrya F.M., Smirnov A.A. Reusable complex Soc level tests creating and debugging method