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Leesment S.I.

NT-MDT Spectrum Instruments

Listing of all the works of the author. Click on the work title to get the full information.

2020
		Bykov V.A., Bykov A.V., Bobrov Y.A., Kotov V.V., Leesment S.I., Polyakov V.V. Possibilities of metrological systems of atomic force microscopy for research, development and control of parameters of micro and nanoelectronic products
2022
		Bykov V.A., Bykov A.V., Bobrov Y.A., Kotov V.V., Leesment S.I., Polyakov V.V. Scanning Probe microscopy for nanostructures investigations from micro and nanoelectronics up to biomaterials