Home
Authors Papers Year of conference Themes Organizations To MES conference
Listing of all the works of the organization. Click on the work title to get the full information.
2008 | |
| |
Davydov G.G., Sogoyan A.V., Petrov A.G., Artamonov A.S., Yashanin I.B., Skobelev A.V., Sedakov A.Yu. Application of a technique of not destroying control of dose stability of parties SoS CMOS VLSI
|
| |
Kharitonov I.A., Petrosyants K.O., Orekhov E.V., Yatmanov A.P., Sambursky L.M. Process and device simulation of CMOS SOI VLSI elements with an account for radiation effects
|
2012 | |
| |
Petrosyants K.O., Kharitonov I.A., Orekhov E.V., Sambursky L.M., Yatmanov A.P., Voevodin A.V. Investigation of single event upset reliability for SOI CMOS SRAM cells using mixed-mode 3D TCAD-SPICE simulation
|
| |
Gryaznov E.G., Mansurov A.N., Petrosyants K.O. Radiation hardened EEPROM structures integrated with SOI CMOS techology
|
2014 | |
| |
Mokeev A.S., Karachkin S.V. SOI MOSFET Compact SPICE model for radiation-hardened 0.35 µm IC design
|
| |
Mokeev A.S., Mansurov A.N., Yatmanov A.P. Scalable diode macromodel with high modeling accuracy
|
2016 | |
| |
Boruzdina A.B., Temirbulatov M.S., Pechenkin A.A., Ulanova A.V., Yashanin I.B., Enns V.I., Yanenko A.V., Chumakov A.I. Features of experimental research methods for memory with error correction
|
2020 | |
| |
Volkova E.I., Popkov S.A. Investigation of nonlinear effects in modeling the sensor element MEMS-vacuum gauge
|
|
|
|