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Listing of all the works of the organization. Click on the work title to get the full information.

2008
		Davydov G.G., Sogoyan A.V., Petrov A.G., Artamonov A.S., Yashanin I.B., Skobelev A.V., Sedakov A.Yu. Application of a technique of not destroying control of dose stability of parties SoS CMOS VLSI
		Stenin V.Ya., Betelin V.B., Bobkov S.G., Krasnyuk A.A., Osipenko P.N., Cherkasov I.G., Chumakov A.I., Yanenko A.V. Prospects of using submicronic CMOS VLSI in failure-proof equipment working under impact of atmospheric neutrons
		Chumakov A.I., Pechenkin A.A., Egorov A.N., Mavritskiy O.B., Baranov S.V., Vasilyev A.L., Krinitskij A.V. SEE sensitive parameters estimation in VLSI using local laser technique
2010
		Sogoyan A.V. Estimation of CMOS VLSI hardness for high dose rate pulse irradiation
		Chibisov P.A., Trubitsyn D.A., Baranov S.V. Memory testing algorithms for microprocessor board radiation test
		Pechenkin A.A., Vasilyev A.L., Kozlov A.A., Koltsov D.O., Orlov A.A., Tararaksin A.S., Chumakov A.I., Yanenko A.V. Test and Computer Simulation Procedure for Single Event Effect Prediction of ICs in a Space Environment
2012
		Egorov A.N., Mavritskiy O.B., Chumakov A.I., Pechenkin A.A., Koltsov D.O. Automated Picosecond Laser Facility for Single Event Effects Simulation in Microelectronic Devices under Space Environment
		Chumakov A.I., Vasilyev A.L., Pechenkin A.A., Savchenkov D.V., Tararaksin A.S., Yanenko A.V. Estimation of ICs SEE Sensitivity Using Local Laser and Pulse Gamma-Ray Technique
		Ulanova A.V., Sogoyan A.V., Chumakov A.I., Nikiforov A.Y., Petrov A.G. Features of the radiation hardness evaluation for integrated circuits in specialized protective packages
		Tararaksin A.S., Nigmatullin R.R., Savchenkov D.V., Solovyov S.A., Yanenko A.V. Single Event Latchup and Catastrophic Failure in CMOS Devices Investigation and Prevention Methods
2014
		Boruzdina A.B., Ulanova A.V., Gorbunov M.S., Chumakov A.I. Dependence of MCU Sensitivity in SRAM on Data Pattern and angle of incident
		Chumakov A.I., Savchenkov D.V., Pechenkin A.A., Mavritskiy O.B., Egorov A.N. Experimental Verification of Some Laser Techniques' Approximations
		Mavritskiy O.B., Egorov A.N., Pechenkin A.A., Savchenkov D.V., Telets V.A. Femtosecond Laser System for VLSI Heavy Ion Induced Single Event Effects Hardness Testing
		Smolin A.A., Ulanova A.V., Sogoyan A.V., Demidov A.A. Modeling TID leakage current in MOS-structures under x-ray and gamma irradiation
		Borisov A.Y., Kessarinskiy L.N. Proton and gamma-radiation ionizing effect comparative results
		Novikov A.A., Pechenkin A.A., Ryasnoy N.V., Chumakov A.I. SEE sensitivity changes at different TID levels
		Usachev N.A., Elesin V.V., Nazarova G.N., Chukov G.V., Telets V.A., Amburkin K.M., Sotskov D.I., Dmitriev V.A., Shelepin N.A. System approach to design UHF RFID reader transceiver ICs
2016
		Boruzdina A.B., Temirbulatov M.S., Pechenkin A.A., Ulanova A.V., Yashanin I.B., Enns V.I., Yanenko A.V., Chumakov A.I. Features of experimental research methods for memory with error correction
		Seletskiy A.V., Shelepin N.A., Smolin A.A., Ulanova A.V. Investigation of the influence dispersion of technological parameters of VLSI on resistance to TID effects by device-technological simulation
		Chumakov A.I., Sogoyan A.V., Boruzdina A.B., Smolin A.A., Pechenkin A.A. Mechanisms of Multiple Cell Upsets in Memory
		Moskovskaya Y., Sorokoumov G., Bobrovsky D.V., Nikiforov A.Y., Denisov A.N., Snicar V.G., Zhukov A.A., Ulanova A.V. Rational composition of typical grading system for ASIC’s radiation hardness testing
2018
		Chumakov A.I., Bobrovsky D.V., Pechenkin A.A., Savchenkov D.V., Sorokoumov G. Non-Stable Single Event Latch-up
		Sogoyan A.V., Chumakov A.I., Smolin A.A. Single Event Rate Evaluation for Modern ICs
2020
		Mozhaev R.K., Lukashin V.P., Ukolov D.S., Pechenkin A.A. Investigation of CMOS Multiplexor SEL Sensitivity at Low Temperature
		Tsirkov A.N., Novikov A.A., Lukashin V.P., Gritsaenko A.R., Pechenkin A.A. The investigation of catastrophic failures in the CCD under the influence of the Heavy-Charged Particles