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Pechenkin A.A.

Listing of all the works of the author. Click on the work title to get the full information.

2008
		Chumakov A.I., Pechenkin A.A., Egorov A.N., Mavritskiy O.B., Baranov S.V., Vasilyev A.L., Krinitskij A.V. SEE sensitive parameters estimation in VLSI using local laser technique
2010
		Pechenkin A.A., Vasilyev A.L., Kozlov A.A., Koltsov D.O., Orlov A.A., Tararaksin A.S., Chumakov A.I., Yanenko A.V. Test and Computer Simulation Procedure for Single Event Effect Prediction of ICs in a Space Environment
2012
		Egorov A.N., Mavritskiy O.B., Chumakov A.I., Pechenkin A.A., Koltsov D.O. Automated Picosecond Laser Facility for Single Event Effects Simulation in Microelectronic Devices under Space Environment
		Chumakov A.I., Vasilyev A.L., Pechenkin A.A., Savchenkov D.V., Tararaksin A.S., Yanenko A.V. Estimation of ICs SEE Sensitivity Using Local Laser and Pulse Gamma-Ray Technique
2014
		Novikov A.A., Pechenkin A.A., Ryasnoy N.V., Chumakov A.I. SEE sensitivity changes at different TID levels
		Mavritskiy O.B., Egorov A.N., Pechenkin A.A., Savchenkov D.V., Telets V.A. Femtosecond Laser System for VLSI Heavy Ion Induced Single Event Effects Hardness Testing
		Chumakov A.I., Savchenkov D.V., Pechenkin A.A., Mavritskiy O.B., Egorov A.N. Experimental Verification of Some Laser Techniques' Approximations
2016
		Chumakov A.I., Sogoyan A.V., Boruzdina A.B., Smolin A.A., Pechenkin A.A. Mechanisms of Multiple Cell Upsets in Memory
		Boruzdina A.B., Temirbulatov M.S., Pechenkin A.A., Ulanova A.V., Yashanin I.B., Enns V.I., Yanenko A.V., Chumakov A.I. Features of experimental research methods for memory with error correction
2018
		Chumakov A.I., Bobrovsky D.V., Pechenkin A.A., Savchenkov D.V., Sorokoumov G. Non-Stable Single Event Latch-up