Russian
English
Home
Authors
Papers
Year of conference
Themes
Organizations
To MES conference
Semenov A.V.
Listing of all the works of the author. Click on the work title to get the full information.
2014
Semenov A.V., Fedorec V.N.
Counterfeit IC detection based on s-parameters measurements
2016
Semenov A.V., Fedorec V.N., Starcev V.N.
Homogeneity Lot of Integrated Circuit Inspection based on Radiofrequency Measurement
2018
Semenov A.V., Starcev V.N., Stepanov E.N.
Technometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection
2020
Starcev V.N., Semenov A.V.
Model for detecting counterfeit recovered SRAM based on accelerated aging
Copyright © 2009-2024 IPPM RAS. All Rights Reserved.
Design of site: IPPM RAS