Home         Authors   Papers   Year of conference   Themes   Organizations        To MES conference

---

Listing of all the works of the organization. Click on the work title to get the full information.

2010
		Andrienko V.A., Ryabtsev V.G., Utkina T.Yu. Method and means of built-in self-testing of memory chip
2016
		Ryabtsev V.G., Shubovich A.A., Feklistov A.S. Diagnostic facilities and configurable digital systems on crystal portable integration
2018
		Evdokimov A.P., Ryabtsev V.G., Melikov A.V. Principles of Designing Devices for Test Diagnosing of High-speed Microchips and Semiconductor Memory
2020
		Volobuev S.V., Evdokimov A.P., Ryabtsev V.G. Design principles for fault-tolerant random access memory for space applications
2021
		Volobuev S.V., Ryabtsev V.G. Implementation of self-testing tools for DDR3 memory modules in Spartan3e FPGA