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| SEE sensitivity changes at different TID levels |
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| Authors |
| | Novikov A.A. |
| | Pechenkin A.A. |
| | Ryasnoy N.V. |
| | Chumakov A.I. |
| Date of publication |
| | 2014 |
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| Abstract |
| | SEU, SEL and SET sensitivity estimation results using laser technique in dependency of TID effects are presented and discussed |
| Keywords |
| | SEU, SEL, SET, TID, laser technique, ion radiation |
| Library reference |
| | Novikov A.A., Pechenkin A.A., Ryasnoy N.V., Chumakov A.I. SEE sensitivity changes at different TID levels // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 3. P. 159-162. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2014/pdf/D131.pdf |
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