Home         Authors   Papers   Year of conference   Themes   Organizations        To MES conference

Debugging and testing of VLSI models with use of the prototypes realized on PLIC

Authors
 Aryashev S.I.
 Kornilenko A.V.
 Chekunov A.V.
Date of publication
 2005

Abstract
 At development of complex IC one of the basic and most labour-consuming problems is testing RTL-model of IC. Verification should be as much as possible full, otherwise even the small mistake can lead to significant loss of time and means. Such situation dictates necessity not only testings in CAD, but also development of prototypes for debugging in real conditions of functioning. In paper ways of functional modelling of a microcircuit in the conditions most reflecting specificity of functioning of a real microcircuit are shown. Merits and disadvantages of various ways and approaches to modelling are shown. The positive effect from the described approach has been got by development of a microcircuit of the graphic accelerator. Besides in paper the opportunity of development of universal plates of prototypes for debugging microcircuits of various type is shown.
Keywords
 VLSI models
Library reference
 Aryashev S.I., Kornilenko A.V., Chekunov A.V. Debugging and testing of VLSI models with use of the prototypes realized on PLIC // Problems of Perspective Microelectronic Systems Development - 2005. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2005. P. 275-280.
URL of paper
 http://www.mes-conference.ru/data/year2005/41.doc

Copyright © 2009-2024 IPPM RAS. All Rights Reserved.

Design of site: IPPM RAS