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SEE sensitive parameters estimation in VLSI using local laser technique
Authors
	Chumakov A.I.
	Pechenkin A.A.
	Egorov A.N.
	Mavritskiy O.B.
	Baranov S.V.
	Vasilyev A.L.
	Krinitskij A.V.
Date of publication
	2008
Abstract
	Sensitive parameters estimation of single event upsets and single event latchup in VLSI is presented. The technique is based on local laser irradiation procedure of VLSI elements and fragments.
Keywords
	Single event effects; radiation hardness; laser irradiation
Library reference
	Chumakov A.I., Pechenkin A.A., Egorov A.N., Mavritskiy O.B., Baranov S.V., Vasilyev A.L., Krinitskij A.V. SEE sensitive parameters estimation in VLSI using local laser technique // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 276-279.
URL of paper
	http://www.mes-conference.ru/data/year2008/50.pdf