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Virtual Tests of Micro- and Nanoelectronic Systems on External Influences
Authors
	Shalumov A.S.
	Travkin D.N.
	Tikhomirov M.V.
Date of publication
	2018
DOI
	10.31114/2078-7707-2018-2-39-45
Abstract
	The article considers the purpose of virtual tests of micro- and nanoelectronic systems and their optimal combination with full-scale tests. The capabilities of the automated system ASONIKA are presented, on the basis of which virtual tests for mechanical (vibration, shock, linear accelerations, acoustic noises), thermal, electromagnetic effects are carried out.
Keywords
	virtual testing, simulation, acceleration, stress, temperature, fatigue failure.
Library reference
	Shalumov A.S., Travkin D.N., Tikhomirov M.V. Virtual Tests of Micro- and Nanoelectronic Systems on External Influences // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2018. Issue 2. P. 39-45. doi:10.31114/2078-7707-2018-2-39-45
URL of paper
	http://www.mes-conference.ru/data/year2018/pdf/D114.pdf