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Design and Testing of Integrated Circuit for Micromechanical Accelerometer  

Authors
 Belyaev Ya.V.
 Kostygov D.V.
 Lemko I.V.
 Mikhteeva A.
 Nevirkovets N.N.
Date of publication
 2018
DOI
 10.31114/2078-7707-2018-4-49-56

Abstract
 Design and testing of an integrated circuit for a micromechanical accelerometer is considered. The design stages of the integrated circuit starting from the system model of the accelerometer and ending with the topology of the integrated circuit are shown. The results of testing the integrated circuit are given.
Keywords
 integrated circuit, microelectronics, microelectromechanical sensors, microelectromechanical systems
Library reference
 Belyaev Ya.V., Kostygov D.V., Lemko I.V., Mikhteeva A., Nevirkovets N.N. Design and Testing of Integrated Circuit for Micromechanical Accelerometer // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2018. Issue 4. P. 49-56. doi:10.31114/2078-7707-2018-4-49-56
URL of paper
 http://www.mes-conference.ru/data/year2018/pdf/D056.pdf

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