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Method for Organizing the Moore Automaton with the Increased Resistance to Soft Failures
Authors
	Egorov I.V.
Date of publication
	2018
DOI
	10.31114/2078-7707-2018-2-136-143
Abstract
	up-to-date design rules used in computer engineering make hardware unreliable when working under radiation. A hit of a charged particle causes a "soft failure" - a situation, when hardware elements remain in usable condition but the information transmitted or stored in memory is corrupted. This problem appeared after the introduction of nanotechnology in production of integration circuits. With old submicron technologies, soft failures occurred much less frequently, because false impulses caused by charged particles were invisible due to the inertia of the logic elements. Now we need to develop new circuitry solutions, which would increase the resistance of hardware (especially finite states machines) to soft failures. Known research revealed, that soft failures occur more often in memory units, than in combinational circuits, and can be eliminated by the periodic recovery of the memory state. In spite of this, the most of known reliable structures of finite state machines are based on structural redundancy, which is not enough efficient in case of soft failures, and don't use self-recovery for memory units. Purpose: suggest new technical solutions to increase the reliability of a Moore automaton working in case of periodic soft failures. Results: the developed structure of Moore automaton with triple redundancy of internal memory and output signals and with self-recovery on each synchronization clock period has increased resistance to the soft errors occurred both in combinational circuits and internal memory. This structure also contains the tools to register a count of soft failures occurred during exploitation, which allow to control the state of the automaton and detect the dangerous state, when soft failures occur too often. The reliability characteristic of the developed structure has been estimated. The reliability analysis has revealed the advantage of the developed structure against known fault-tolerant structures of the Moore automaton - in case of periodic soft failures it's operating time to failure is greater by an order of magnitude.
Keywords
	finite state machine, combinational circuit, reliability analysis, synchronization, soft failures, structural redundancy, recoverable systems, probability of non-failure.
Library reference
	Egorov I.V. Method for Organizing the Moore Automaton with the Increased Resistance to Soft Failures // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2018. Issue 2. P. 136-143. doi:10.31114/2078-7707-2018-2-136-143
URL of paper
	http://www.mes-conference.ru/data/year2018/pdf/D042.pdf