| The method of EFSM extraction from HDL: application to functional verification |
|
|
| Authors |
| | Kamkin A.S. |
| | Smolov S.A. |
| Date of publication |
| | 2014 |
|
| Abstract |
| | The increasing complexity of hardware designs makes functional verification a really complex task. Modern verification methods of HDL are usually based on “good” models for automated test generation or formal property checking. In this paper, we describe techniques for deriving EFSM-based models from HDL descriptions and discuss applications of such models for verification. |
| Keywords |
| | functional verification, HDL model, EFSM, guarded action, static analysis, functional test generation |
| Library reference |
| | Kamkin A.S., Smolov S.A. The method of EFSM extraction from HDL: application to functional verification // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 2. P. 113-118. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2014/pdf/D111.pdf |
