| A technique to the design-for-testability automation of analogue IC based on OBIST |
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| Authors |
| | Mosin S.G. |
| Date of publication |
| | 2014 |
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| Abstract |
| | A technique for design-for-testability automation of analogue IC based on OBIST specifying design procedures for development testing circuitries and test conditions is proposed in the paper. The structural solutions on reconfiguring an original circuit into oscillator and rules providing conditions for the IC oscillating in a test mode are offered. The examples of testing circuitries implementation for active filters are demonstrated. |
| Keywords |
| | automation, design-for-testability, reconfiguring, analog integrated circuits, OBIST |
| Library reference |
| | Mosin S.G. A technique to the design-for-testability automation of analogue IC based on OBIST // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 1. P. 95-100. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2014/pdf/D020.pdf |
