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Using of VBIC model for SiGe integrated circuit application

Authors
 Chaplygin Yu.A.
 Adamov Yu.F.
 Timoshenkov V.P.
Date of publication
 2014

Abstract
 Using of VBIC model SiGe IC application is investigated. Comparison of model parameters and experimental results is done. Influence of base resistance on static characteristic is developed.
Keywords
 heterojunction bipolar transistor (HBT), silicon-germanium, VBIC model
Library reference
 Chaplygin Yu.A., Adamov Yu.F., Timoshenkov V.P. Using of VBIC model for SiGe integrated circuit application // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 3. P. 93-98.
URL of paper
 http://www.mes-conference.ru/data/year2014/pdf/D018.pdf

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