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Experience of designing built-in means and methods of characteristics measurement concerning microelectronic systems
Authors
	Zubakov A.V.
	Kondratenko S.V.
	Sevryukov A.N.
Date of publication
	2005
Abstract
	A general approach to designing built-in means and methods of laboratory or production testing of various type and destination microelectronic units is presented. These means and methods are intended to reject products as well as to conduct qualifying tests, providing for the measurement of the given units main characteristics, taking into account the possibilities and restrictions, imposed by the existing measuring equipment. Some examples of implementing the built-in means and methods for the designed and made digital and mixed-signal integrated circuits and intellectual property blocks are presented.Some examples of built-in means and methods realization for designed and made integrated circuits and intellectual property blocks are presented.
Keywords
	built-in test means, typical valuation scheme, control of supply current in the quiescent state(IDDQ), screening, qualifying tests
Library reference
	Zubakov A.V., Kondratenko S.V., Sevryukov A.N. Experience of designing built-in means and methods of characteristics measurement concerning microelectronic systems // Problems of Perspective Microelectronic Systems Development - 2005. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2005. P. 328-333.
URL of paper
	http://www.mes-conference.ru/data/year2005/49.doc