| Metrological problems of spectral estimation of varying process parameters and methods for their solution by means of modern computer technology |
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| Authors |
| | Khanyan G.S. |
| Date of publication |
| | 2008 |
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| Abstract |
| | The paper is a summary aimed at drawing the attention of developers of measurement and computing devices for various applications to the fundamental problems of discrete spectral analysis theory and practice requiring a solution based on modern microelectronics components. The report presentation methodology comprises formulation and analytical solution of the metrological problem arising in the course of developing spectral analysis applications for measuring amplitude, phase and frequency characteristics of the oscillatory processes of various physical nature. Methods for estimating harmonic processes parameters obtained as a result of the task solution are given in their relationship and in comparison with other methods known in the literature. Numerical simulation and spectral analysis of signals for evaluating the accuracy of methods and defining the boundaries of their applicability are also presented. |
| Keywords |
| | level quantization; signal cutting; analog-to-digital conversion; estimation of parameters; spectral analysis; numerical modeling |
| Library reference |
| | Khanyan G.S. Metrological problems of spectral estimation of varying process parameters and methods for their solution by means of modern computer technology // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 496-503. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2008/94.pdf |
