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Features of simulation of SiGe:C heterojunction bipolar transistor

Authors
 Petrosyants K.O.
 Torgovnikov R.A.
Date of publication
 2008

Abstract
 In work features of simulation of SiGe:C heterojunction bipolar transistors are presented.
Dependences of boundary frequency fT and pressure of breakdown BVcbo of collector transition SiGe:C from concentration of carbon in base are investigated with method of device-technological simulation.
Keywords
 simulation of SiGe:C heterojunction bipolar transistor
Library reference
 Petrosyants K.O., Torgovnikov R.A. Features of simulation of SiGe:C heterojunction bipolar transistor // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 231-234.
URL of paper
 http://www.mes-conference.ru/data/year2008/40.pdf

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