| Method of rule checks of electromigration in VLSI |
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| Authors |
| | Melikyan V.Sh. |
| Date of publication |
| | 2008 |
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| Abstract |
| | A new method for checking the rules of electromigration in VLSI, as well as the possibility of an appropriate software package, taking into account the realities of sub-micron technologies and meeting the practical requirements of modern VLSI design is presented. |
| Keywords |
| | design rule check, electromigration, VLSI |
| Library reference |
| | Melikyan V.Sh. Method of rule checks of electromigration in VLSI // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 159-163. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2008/26.pdf |
