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The magnetic tunnel junction model for circuit design systems

Authors
 Kostrov A.I.
 Stempitsky V.R.
 Danilyuk A.L.
 Borisenko V.E.
Date of publication
 2008

Abstract
 The electrical macromodel of magnetic tunnel junction (MTJ) in the Verilog-AMS mixed-signal behavioral description language has been developed. The model is the basis for circuit simulation of a memory cell on tunnel magnetoresistance effect (MRAM). Experimental data and testing results of the model in Cadence Design System are presented.
Keywords
 Magnetoresistance memory, spintronics, magnetic tunnel junction, electrical model, equivalent circuit, Verilog-AMS
Library reference
 Kostrov A.I., Stempitsky V.R., Danilyuk A.L., Borisenko V.E. The magnetic tunnel junction model for circuit design systems // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2008. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2008. P. 77-80.
URL of paper
 http://www.mes-conference.ru/data/year2008/10.pdf

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