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Sivchenko A.S.

Listing of all the works of the author. Click on the work title to get the full information.

2014
		Sivchenko A.S. Development of methods for the analysis of defects in the gate dielectric on the test structures in the wafers
2016
		Sivchenko A.S. Methods electromigration analysis conducting lines using the accelerated measurement test structures located in the wafer