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Voevodin A.V.

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2012 
  Petrosyants K.O., Kharitonov I.A., Orekhov E.V., Sambursky L.M., Yatmanov A.P., Voevodin A.V.
Investigation of single event upset reliability for SOI CMOS SRAM cells using mixed-mode 3D TCAD-SPICE simulation
 

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