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Listing of all the works of the author. Click on the work title to get the full information.
| 2012 | |
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Ulanova A.V., Sogoyan A.V., Chumakov A.I., Nikiforov A.Y., Petrov A.G.
Features of the radiation hardness evaluation for integrated circuits in specialized protective packages
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| 2014 | |
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Smolin A.A., Ulanova A.V., Sogoyan A.V., Demidov A.A.
Modeling TID leakage current in MOS-structures under x-ray and gamma irradiation
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Boruzdina A.B., Ulanova A.V., Gorbunov M.S., Chumakov A.I.
Dependence of MCU Sensitivity in SRAM on Data Pattern and angle of incident
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| 2016 | |
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Moskovskaya Y., Sorokoumov G., Bobrovsky D.V., Nikiforov A.Y., Denisov A.N., Snicar V.G., Zhukov A.A., Ulanova A.V.
Rational composition of typical grading system for ASIC’s radiation hardness testing
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Seletskiy A.V., Shelepin N.A., Smolin A.A., Ulanova A.V.
Investigation of the influence dispersion of technological parameters of VLSI on resistance to TID effects by device-technological simulation
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Boruzdina A.B., Temirbulatov M.S., Pechenkin A.A., Ulanova A.V., Yashanin I.B., Enns V.I., Yanenko A.V., Chumakov A.I.
Features of experimental research methods for memory with error correction
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