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The post-silicon validation method of standard cell libraries
Authors
	Ilin S.A.
	Kopeikin D.Yu.
	Lastochkin O.V.
	Novikov A.A.
	Shipitsin D.S.
Date of publication
	2020
DOI
	10.31114/2078-7707-2020-4-140-145
Abstract
	The problem of validation DDK is fundamental and that of being independent of the semiconductor technology level. Taking a new modern submicron technology stage increase significantly its actuality because mistakes in a project inheritable from the DDK, to lead inevitably to a significant expense for determining and correcting. The article describes the research and development of the silicon-post validation method for standard cell libraries of DDK. Decreasing the technology size of elements, high level of competitiveness and increasing the production cost of a project, are forming an actual task of the support of high quality of DDK. When we speak about the quality of DDK, it means a total absence of the mistakes; conformity between behaving SPICE modeling and measurement of the chip; functional testing in the different operating modes for each element of DDK. Modern DDK can contain of hundreds to thousands of STD cells, to be complicating substantially their full check. In the paper are shown to be during the front-end design for either project to be used less than half of the accessed set of the STD cells. In theory, it allows validating the functionality and characteristics of a limited set for main elements of a library, to spread these results for all cells of DDK in common but it does not guarantee complete correctness of the project if during the synthesis process to be used invalidated cells. It's important to note that there are the directions of the design for which unacceptable any fluctuations of the most important characteristics of STD cells. In order to guarantee the required level of the special effect protection for a finished development product on the special effects to need all parts of the product to be protected. So to guarantee the necessary level of protection for your complete project you can have done it only after checking the post-silicon validation all elements of the project, to include in the structure. By this day there are a lot of evaluation effects radiation influence methods by SPICE-modeling but post-silicon validation has higher priority and reliability. Complex post-silicon validation will allow us to resolve the task of detecting elements of DDK which not correspond required parameters (e.g. special effect protection, power consumption, leakage etc.) in order to redesign further it to increase the complex quality of DDK. Thus, it is necessary to create the post-silicon validation method of DDK that support effective resolve mentioned issues.
Keywords
	DDK, STD, IC, Post-Silicon validation, standard cell, libraries, semiconductor.
Library reference
	Ilin S.A., Kopeikin D.Yu., Lastochkin O.V., Novikov A.A., Shipitsin D.S. The post-silicon validation method of standard cell libraries // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2020. Issue 4. P. 140-145. doi:10.31114/2078-7707-2020-4-140-145
URL of paper
	http://www.mes-conference.ru/data/year2020/pdf/D037.pdf