| Search for a rational structure of a test generator for subsystems of built-in self-testing of digital circuits |
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| Authors |
| | Bykhanova N.V. |
| | Mosin S.G. |
| Date of publication |
| | 2020 |
| DOI |
| | 10.31114/2078-7707-2020-1-89-94 |
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| Abstract |
| | The aim of the proposed study is a searching for an algorithm for determining the rational structure of a test genera-tor for digital circuits testing. The test generator is based on the LFSR (Linear-Feedback Shift Register). The LFSR structure is formed using the Berlekamp–Massey algorithm. Such a structure allows the generation of deterministic and pseudo-random test sets without using additional control subcircuits to switch between test modes. In the course of the study, an analysis was made of the dependence of the total number of deterministic and pseudorandom test sets needed to achieve a complete coverage of faults on the length of the deter-ministic part of the test sets sequence on the basis of which the test generator is built. The task was defined as a structural optimization of the test generator. The corresponding objective functions were determined. An algorithm on searching for the rational structure of the test generator was determined based on the results of the analysis. The obtained generator provides complete fault coverage at a small area of the testing subcircuit and an acceptable test execution time. |
| Keywords |
| | built-in self-test, test generator, LFSR, fault coverage |
| Library reference |
| | Bykhanova N.V., Mosin S.G. Search for a rational structure of a test generator for subsystems of built-in self-testing of digital circuits // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2020. Issue 1. P. 89-94. doi:10.31114/2078-7707-2020-1-89-94 |
| URL of paper |
| | http://www.mes-conference.ru/data/year2020/pdf/D045.pdf |
