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Yield enhancement of standard cell layout
Authors
	Mukhanov K.S.
	Sotnikov M.A.
	Ulukhanov E.A.
Date of publication
	2006
Abstract
	Yield enhancement of standard cell layouts is an actual task. In this article the problem of automatic improvement of standard cell layout is considered. The effective algorithm is offered. Suggested algorithm applies DFM rules without increasing layout area. Also, an algorithm of redundant contacts insertion is offered. Experimental results confirm efficiency of the developed algorithms.
Keywords
	yield, recommended rules, DFM, standard cells
Library reference
	Mukhanov K.S., Sotnikov M.A., Ulukhanov E.A. Yield enhancement of standard cell layout // Problems of Perspective Microelectronic Systems Development - 2006. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2006. P. 115-119.
URL of paper
	http://www.mes-conference.ru/data/year2006/19.pdf