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Pressure sensor test evaluation using fractal analysis methods
Authors
	Klevtsov S.I.
Date of publication
	2020
DOI
	10.31114/2078-7707-2020-2-140-146
Abstract
	The measurement error of the microprocessor pressure sensor depends on the correct construction of its conversion characteristics. The conversion characteristic of the sensor is formed on the basis of the results of calibration tests. During calibration tests, deviations from the established procedure are possible, which can lead to inaccuracies in the conversion characteristics. To assess the quality of the conversion characteristics, it is proposed to use the methods of fractal analysis. During the test, data from the pressure sensor is cyclically taken at fixed values of the environmental parameters. The results of several test cycles with constant environmental parameters should be independent of each other and similar in shape. If such a relationship exists, then the test cycles are not independent. This can lead to a decrease in the metrological characteristics of the sensor, since the constructed conversion characteristic will be significantly different from the real one. The paper presents a method for assessing the quality of the results of calibration tests of a pressure sensor. The proposed method is based on the use of the normalized swing method. The assessment of the degree of repeatability of the form of test cycles and their mutual independence is determined using the Hurst indicator. The Hurst index for a series based on the results of several test cycles at a fixed ambient temperature should be less than 0.5. In this case, the series is antipersistent. The test results in this case can be used to build a qualitative conversion characteristic. Another value of the Hurst indicator means violations during the measurement or the presence of deficiencies in the test method.
Keywords
	conversion characteristic, Hurst exponent, sensor, pressure, test, time series
Library reference
	Klevtsov S.I. Pressure sensor test evaluation using fractal analysis methods // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2020. Issue 2. P. 140-146. doi:10.31114/2078-7707-2020-2-140-146
URL of paper
	http://www.mes-conference.ru/data/year2020/pdf/D021.pdf