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| Rational composition of typical grading system for ASIC’s radiation hardness testing |
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| Authors |
| | Moskovskaya Y. |
| | Sorokoumov G. |
| | Bobrovsky D.V. |
| | Nikiforov A.Y. |
| | Denisov A.N. |
| | Snicar V.G. |
| | Zhukov A.A. |
| | Ulanova A.V. |
| Date of publication |
| | 2016 |
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| Abstract |
| | Valid standard documents established testing of every production batch of plates for resistance to special factors by the subgroup E. Test production batch is done as a part of the development and delivery concrete types of LSI based on the ASIC.
For the purpose of test a production batch of ASIC’s plates used a test integrated circuit (IC) with zero firmware. Zero firmware used for the ASIC’s certification of design and cell library. In fact, zero firmware is a valuation scheme.
The rational composition of the standard evaluation schemes used for control IC’s technological process. For the radiation hardness standard evaluation schemes must perform the following tasks:
1. Ensuring of operational and reliable assessment of the radiation hardness of finished products in the manufacturing process of chips, based on the continuous and periodic monitoring of indicators of resistance valuation schemes.
2. Ensuring the safety of products and control of hardness indicators when making controlled changes in manufacturing processes.
3. Monitoring the impact of dispersion of electro and electrical parameters of the chips on the plate within the production part, as well as from batch to batch, the stability of the parameters of radiation hardness. |
| Keywords |
| | typical grading system, ASIC, radiation hardness |
| Library reference |
| | Moskovskaya Y., Sorokoumov G., Bobrovsky D.V., Nikiforov A.Y., Denisov A.N., Snicar V.G., Zhukov A.A., Ulanova A.V. Rational composition of typical grading system for ASIC’s radiation hardness testing // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2016. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2016. Part 4. P. 153-157. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2016/pdf/D193.pdf |
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