Home         Authors   Papers   Year of conference   Themes   Organizations        To MES conference

Optimization methods of coding circuits based on the binary decision diagrams for synthesis of fault-tolerant micro- and nanoelectronic circuits
Authors
	Gavrilov S.V.
	Zhukova T.D.
	Ryzhova D.I.
Date of publication
	2016
Abstract
	Today with the using of new process technology the level of integration is increased and technological sizes are decreased. This leads to the need to improve the reliability and noise immunity of integrated circuits in extreme operating conditions. Approaches to solving this problem based on linear and cyclic codes are typically used to protect transmission and storage data. But they are not intended to improve the noise immunity of combinational circuits. Majority approach is used as a schematic solution, followed by a vote on their outputs. In this case, the assumption about the absolute reliability of the voter is made, but in practice it is not true and leads to an overestimation of the microsystems reliability. In addition, there is no possibility of flexible control of redundancy for obtained solutions in majority approaches. This leads to the impossibility of adapting them to the requirements of design circuits. To solve this problem, in this paper we propose to use the coding method in basis of the Galois field. This method is based on the using of structural redundancy. It provides the desired level of noise immunity and the requirements of hardware costs minimization. Also we propose a method for optimizing the coding circuits with the use of binary decision diagrams for various commutations of duplicate circuit outputs.
Keywords
	Galois field, noise tolerance, binary decision diagram (BDD).
Library reference
	Gavrilov S.V., Zhukova T.D., Ryzhova D.I. Optimization methods of coding circuits based on the binary decision diagrams for synthesis of fault-tolerant micro- and nanoelectronic circuits // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2016. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2016. Part 4. P. 158-165.
URL of paper
	http://www.mes-conference.ru/data/year2016/pdf/D013.pdf