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Diagnostic facilities and configurable digital systems on crystal portable integration
Authors
	Ryabtsev V.G.
	Shubovich A.A.
	Feklistov A.S.
Date of publication
	2016
Abstract
	The problem of automated system diagnostics and configurable digital systems on crystal portable integration is at issue. The structure of high-speed performance multiprocessor vector inverter able to perform test bits random-shift operations during one clock signal cycle is suggested. For performing the SoC test diagnostics the determinate and pseudo-random tests generator, algorithmic generators and other aids are employed. Thereby the generated tests are indexed vectors wherein single bits are ordered in a strictly defined sequence in which they must be transmitted to test object’s edgecard pins. Nevertheless due to the SoC crystal design features the bus pins physical location is random. The output signal from a testing object’s pins could be transformed into an ordered sequence and then compared with early prepared master values. Ordered sequences of test signals and master responses generate a testing object’s logical direction. Certain location of SoC edgecard pins corresponding to input or output buses is an object’s physical direction. In that case the task of identification of an object’s physical and logical directions is set. The designed structure of multiprocessor vector inverter contains a vector’s bit decoder, operation processors consisting of storage register for vector’s bit logical and physical directions correspondence code. The converter units for stimulus vectors unpacking and packaging response vectors based on the structural schematic are required. The difference between multiprocessor vector converters is in that stimulus vectors’ storage registers contain matrix M codes of object’s physical and logical directions correspondence and the responses converter contains codes of reciprocal matrix In preparation for diagnosis of new type of SoC the multiprocessor vector convertors initialization is in progress. The stimulus vector converter’s registers are populating with codes of matrix M for new testing object and responses vector converter’s register is populating with codes of matrix using the bit decoder.
Keywords
	portable intregration, testing, system-on-a-chip, SoC.
Library reference
	Ryabtsev V.G., Shubovich A.A., Feklistov A.S. Diagnostic facilities and configurable digital systems on crystal portable integration // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2016. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2016. Part 2. P. 84-91.
URL of paper
	http://www.mes-conference.ru/data/year2016/pdf/D014.pdf