| Counterfeit IC detection based on s-parameters measurements |
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| Authors |
| | Semenov A.V. |
| | Fedorec V.N. |
| Date of publication |
| | 2014 |
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| Abstract |
| | Counterfeiting is a problem that requires multiple test methods to detect the various anomalies. We propose simple detection method based on s-parameters measurements. This research is important because the counterfeit components market is growing fast over the past few years. |
| Keywords |
| | Counterfeit IC, NBTI, HCI, s-parameters |
| Library reference |
| | Semenov A.V., Fedorec V.N. Counterfeit IC detection based on s-parameters measurements // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 3. P. 21-24. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2014/pdf/D139.pdf |
