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On one method of defining functional coverage metrics for microprocessor testing
Authors
	Khisambeev I.Sh.
	Chibisov P.A.
Date of publication
	2014
Abstract
	Functional verification is an integral part of microelectronic systems development flow, including microprocessors developing process. The article deals with research and development of a way for test thoroughness estimation. Such concepts as user defined test coverage metrics at the ISA level, coverage tasks, coverage model are discussed. The experimental results of the proposed methodology are described.
Keywords
	functional verification, stochastic testing, microprocessor, test coverage metrics, coverage tasks, random test generation, coverage model, random test generation.
Library reference
	Khisambeev I.Sh., Chibisov P.A. On one method of defining functional coverage metrics for microprocessor testing // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 2. P. 63-68.
URL of paper
	http://www.mes-conference.ru/data/year2014/pdf/D104.pdf