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Design of the error-correcting code blocks using the two-phase CMOS logic elements

Authors
 Katunin Yu.V.
 Levin K.E.
Date of publication
 2014

Abstract
 It’s possible to use two-phase CMOS logic elements to improve SET-tolerance of the error-correction code blocks. Simulation results of two-phase 28 nm CMOS XOR elements with various configurations of internal electrical couplings under influence of the input voltage noise pulses are presented. Test library contained two-phase logic elements was designed. Using this library layout of the Hsiao (72, 64) error-correcting code block was synthesized.
Keywords
 Error-correcting code, two-phase CMOS logic, layout synthesis
Library reference
 Katunin Yu.V., Levin K.E. Design of the error-correcting code blocks using the two-phase CMOS logic elements // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 4. P. 33-36.
URL of paper
 http://www.mes-conference.ru/data/year2014/pdf/D071.pdf

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