Home         Authors   Papers   Year of conference   Themes   Organizations        To MES conference

A technique to the design-for-testability automation of analogue IC based on OBIST

Authors
 Mosin S.G.
Date of publication
 2014

Abstract
 A technique for design-for-testability automation of analogue IC based on OBIST specifying design procedures for development testing circuitries and test conditions is proposed in the paper. The structural solutions on reconfiguring an original circuit into oscillator and rules providing conditions for the IC oscillating in a test mode are offered. The examples of testing circuitries implementation for active filters are demonstrated.
Keywords
 automation, design-for-testability, reconfiguring, analog integrated circuits, OBIST
Library reference
 Mosin S.G. A technique to the design-for-testability automation of analogue IC based on OBIST // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2014. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2014. Part 1. P. 95-100.
URL of paper
 http://www.mes-conference.ru/data/year2014/pdf/D020.pdf

Copyright © 2009-2024 IPPM RAS. All Rights Reserved.

Design of site: IPPM RAS