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| Features of the radiation hardness evaluation for integrated circuits in specialized protective packages |
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| Authors |
| | Ulanova A.V. |
| | Sogoyan A.V. |
| | Chumakov A.I. |
| | Nikiforov A.Y. |
| | Petrov A.G. |
| Date of publication |
| | 2012 |
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| Abstract |
| | In this paper WALOPACK and RAD-PAK packages electron and gamma radiation shielding efficiency is evaluated. Radiation test features for the locally shielded integrated circuits is considered |
| Keywords |
| | radiation hardness, ionizing radiation, total dose, reduction factor, IC, certification |
| Library reference |
| | Ulanova A.V., Sogoyan A.V., Chumakov A.I., Nikiforov A.Y., Petrov A.G. Features of the radiation hardness evaluation for integrated circuits in specialized protective packages // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2012. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2012. P. 584-587. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2012/pdf/D155.pdf |
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