Features of application ECC methods in sub-100 nm SRAMs for space systems |
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Authors |
| Krasnyuk A.A. |
| Petrov K.A. |
Date of publication |
| 2012 |
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Abstract |
| It is considered the basic and advanced multiple errors correction methods in sub-100nm SRAMs for space systems |
Keywords |
| Static RAM (SRAM), TID and SEE radiation effects, Error-Correction Codes, Hamming codes. |
Library reference |
| Krasnyuk A.A., Petrov K.A. Features of application ECC methods in sub-100 nm SRAMs for space systems // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2012. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2012. P. 638-641. |
URL of paper |
| http://www.mes-conference.ru/data/year2012/pdf/D125.pdf |