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| Methods for providing resilience to single chip developments in the design of radiation-resistant microcircuits |
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| Authors |
| | Achkasov V.N. |
| | Smerek V.A. |
| | Utkin D.M. |
| | Zolnikov V.K. |
| Date of publication |
| | 2012 |
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| Abstract |
| | The influence of single failures in the work of digital devices. Shows the implementation of methods to protect against single failures in the sample chip and Ê1830ÂÅ32ÓÌ 1830ÂÅ32Ó. |
| Keywords |
| | Integrated circuits, single failure, structural redundancy, time redundancy, software redundancy. |
| Library reference |
| | Achkasov V.N., Smerek V.A., Utkin D.M., Zolnikov V.K. Methods for providing resilience to single chip developments in the design of radiation-resistant microcircuits // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2012. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2012. P. 634-637. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2012/pdf/D86.pdf |
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