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Test automation tool for the computing unit of the recurrent operational level

Authors
 Volchek V.N.
 Zelenov R.A.
 Prokofyev A.A.
Date of publication
 2012

Abstract
 The paper represents common problems connected with testing of the recurrent digital signal processor as well as special issues of the the computing device testing. The designed test automation tool for computing unit of the recurrent operational level is described. Advantages of this approach are presented.
Keywords
 test automation, computing unit, dataflow architecture, recurrence, ModelSim, VHDL
Library reference
 Volchek V.N., Zelenov R.A., Prokofyev A.A. Test automation tool for the computing unit of the recurrent operational level // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2012. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2012. P. 137-142.
URL of paper
 http://www.mes-conference.ru/data/year2012/pdf/D49.pdf

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