| The approach to investigation of analog ICs radiation hardness |
|
|
| Authors |
| | Dvornikov O.V. |
| | Tchekhovski V.A. |
| Date of publication |
| | 2010 |
|
| Abstract |
| | The configuration of control equipment, the choice of input signal and test circuitry
of analog IC for investigation of irradiation damage is described. New estimation criterion of IC parametric variation cased by radiation is proposed. Paper describes operation-routing sequence of the irradiation tests and control system diagram of the proposed test setup. Special attention is focused on Single Event Effects monitoring. |
| Keywords |
| | radiation hardness; remote measurement of parameters; bipolar analog IC; single
event effects; single event upset. |
| Library reference |
| | Dvornikov O.V., Tchekhovski V.A. The approach to investigation of analog ICs radiation hardness // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 289-294. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2010/papers/m10-326-11403.pdf |
