| CMOS analog blocks technology migration |
|
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| Authors |
| | Makarov A.B. |
| Date of publication |
| | 2010 |
|
| Abstract |
| | Technology migration of well known CMOS OPAMP is investigated. Technology feature size scaling down behavior of DC, AC and dynamic OPAMP’s parameters is analyzed. Various migration scenarios with change of regime current and MOS transistor’s sizes are discussed. Those
scenarios can be used in accordance to required goal function to improve OPAMP’s area, dynamic
parameters and own noise. |
| Keywords |
| | technology migration, CMOS, OPAMP. |
| Library reference |
| | Makarov A.B. CMOS analog blocks technology migration // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 553-558. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2010/papers/m10-140-67212.pdf |
