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| Test and Computer Simulation Procedure for Single Event Effect Prediction of ICs in a Space Environment |
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| Authors |
| | Pechenkin A.A. |
| | Vasilyev A.L. |
| | Kozlov A.A. |
| | Koltsov D.O. |
| | Orlov A.A. |
| | Tararaksin A.S. |
| | Chumakov A.I. |
| | Yanenko A.V. |
| Date of publication |
| | 2010 |
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| Abstract |
| | An approach is presented for predicting single event effects (SEEs) rate in ICs exposed to heavy ions and high energy protons. The procedure involves an evaluation of the radiation
environment for the ICs and an estimation of their SEE sensitivity parameters, with the latter based on tests and computer simulations. |
| Keywords |
| | single event effect, local laser irradiation, linear energy transfer, cross section. |
| Library reference |
| | Pechenkin A.A., Vasilyev A.L., Kozlov A.A., Koltsov D.O., Orlov A.A., Tararaksin A.S., Chumakov A.I., Yanenko A.V. Test and Computer Simulation Procedure for Single Event Effect Prediction of ICs in a Space Environment // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 269-274. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2010/papers/m10-267-86001.pdf |
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