| The way design for testability of logical transformers |
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| Authors |
| | Turin S.V. |
| | Podvalny S.L. |
| | Akinina Yu.S. |
| Date of publication |
| | 2010 |
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| Abstract |
| | the subjects of the investigation are the principles of building and practical realization of logical BIST-systems.
To answer the task the new way of solution was used: from the rational structure of test matrix
to testability structure of logical transformers. On the basis of geometry theory of management it
is proved that the task of synthesis of retinal tests is better to put and solve as the task of dedicated decrease up to maximum value of symmetry bit structure of test matrix (T- matrix) or as the task of maximum binary “antagonism” logical meanings in controlled points of digital device. |
| Keywords |
| | design for testability, logical transformer, Zhegalcin basis |
| Library reference |
| | Turin S.V., Podvalny S.L., Akinina Yu.S. The way design for testability of logical transformers // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 36-41. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2010/papers/m10-247-11441.pdf |
