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CMOS-APS element with high charge-collection efficiency

Authors
 Pugachev A.A.
 Stempkovsky A.L.
Date of publication
 2010

Abstract
 The new structure of CMOS active pixel sensor with high charge collection efficiency is developed. The electric fields in special full depleted epitaxial layers carries the photogenerated electrons to photodiode area. The technological parameters of the new device are obtained by two-dimensional device simulation.
Keywords
 CMOS image sensor pixel, pixel structure, two-dimensional device modeling, fill-factor
Library reference
 Pugachev A.A., Stempkovsky A.L. CMOS-APS element with high charge-collection efficiency // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 648-653.
URL of paper
 http://www.mes-conference.ru/data/year2010/papers/m10-144-65161.pdf

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