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Memory testing algorithms for microprocessor board radiation test
Authors
	Chibisov P.A.
	Trubitsyn D.A.
	Baranov S.V.
Date of publication
	2010
Abstract
	The paper proposes algorithms for different memory types testing in adverse ambient conditions.
Keywords
	Testing, memory
Library reference
	Chibisov P.A., Trubitsyn D.A., Baranov S.V. Memory testing algorithms for microprocessor board radiation test // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 257-260.
URL of paper
	http://www.mes-conference.ru/data/year2010/papers/m10-156-12871.pdf