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| Methods to control the hardness of specialized VLSI to space natural ionizing radiation |
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| Authors |
| | Anashin V.S. |
| | Ishutin I.O. |
| | Ulimov V.N. |
| | Emeliyanov V.V. |
| Date of publication |
| | 2010 |
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| Abstract |
| | The article describes the routine to control hardness to space ionizing radiation (tests and estimations) of electronic components, designed for space applications. Test equipment for fixation of single event effects, created by JSC “INSTITUTE OF SPACE DEVICE ENGINEERING” is also considered. |
| Keywords |
| | space ionizing radiation, electronic components, control methods, single event effects, test equipment. |
| Library reference |
| | Anashin V.S., Ishutin I.O., Ulimov V.N., Emeliyanov V.V. Methods to control the hardness of specialized VLSI to space natural ionizing radiation // Problems of Perspective Micro- and Nanoelectronic Systems Development - 2010. Proceedings / edited by A. Stempkovsky, Moscow, IPPM RAS, 2010. P. 233-236. |
| URL of paper |
| | http://www.mes-conference.ru/data/year2010/papers/m10-20-92881.pdf |
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